Abstract
The number of patents increases quickly, while more and more low-quality patents are emerging. It's important to identify high-quality patents from massive data quickly and accurately for organizational R&D decision-making and patent layout. However, due to low percentage of high-quality patents, it is challenging to identify them efficiently. In order to solve above problem, we reconstruct the existing index system for identifying high-quality patents by adding 4 features from technological strength of patentees. Furthermore, we propose an improved model by integrating resampling technique and ensemble learning algorithm. First, generative adversarial networks (GAN) are used to expand minority samples. Second, Extreme Gradient Boosting algorithm (XGBoost) with Bayesian optimization (BO) is used to identify high-quality patents. For clarity, this model is called a GAN-BO-XGBoost model. To test the effectiveness of above model, we use patent data in field of lithography technology. Tenfold cross-validation is carried out to evaluate the performance between our proposed model and other models. The results show that GAN-BO-XGBoost model performs better and it's more stable than other models.