Abstract
Understanding the spatial dynamics of nanoscale exciton transport beyond the temporal decay is essential for further improvements of nanostructured optoelectronic devices, such as solar cells. The diffusion coefficient (D) of the nonfullerene electron acceptor Y6 has so far only been determined indirectly, from singlet-singlet annihilation (SSA) experiments. Here, we present the full picture of the exciton dynamics, adding the spatial domain to the temporal one, by spatiotemporally resolved photoluminescence microscopy. In this way, we directly track diffusion and we are able to decouple the real spatial broadening from its overestimation given by SSA. We measured the diffusion coefficient, D = 0.017 ± 0.003 cm(2)/s, which gives a Y6 film diffusion length of [Formula: see text] nm. Thus, we provide an essential tool that enables a direct and free-of-artifacts determination of diffusion coefficients, which we expect to be pivotal for further studies on exciton dynamics in energy materials.