Abstract
To perform quality assessments of both metal alloys and many other engineering materials, measurements of the volume fractions of phases or microstructure components are utilized. For this purpose, quantitative analysis of the evaluated components' distribution on metallographic specimens is often employed. Phases or components of the microstructure are identified based on the variation in signal received in the band of light seen. Problems with the correct identification of measurement results in this spectral band can be caused by the inhomogeneity of the etching when the alloy components are segregated. Additional uncertainty arises when the analyzed image pixel contains a boundary between grains of different phases. This article attempts to use the results of local chemical composition measurements as a source signal for quantitative evaluation of phase composition. For this purpose, quantitative maps of elemental concentration distributions, obtained with a Tescan Mira GMU high-resolution scanning electron microscope in QuantMap mode, were used as input data for the phase composition evaluation of an EN AC 46000 alloy sample. The X-ray microanalysis signal generation area may contain grains of more than one phase. Therefore, evaluation of the phase fractions in areas of individual measurements were calculated by looking for the minimum of the objective function, calculated as the sum of the squares of the deviations of the results of measurements of the concentration of individual elements from the weighted average values of solubilities of these elements in the phases.