Machine learning for microscopy data analytics targeting real-time optical characterization of semiconductor nanocrystals
机器学习在显微镜数据分析中的应用,旨在实现半导体纳米晶体的实时光学表征
期刊:Nature Communications
影响因子:15.7
doi:10.1038/s41467-026-68939-7
Mukherjee, Amitrajit; Reynaerts, Robby; Pradhan, Bapi; Seth, Sudipta; Rösch, Andreas T; Banerjee, Tamali; Chouhan, Lata; Jin, Handong; Sternemann, Christian; Paulus, Michael; Leoncino, Luca; Mali, Kunal S; De Feyter, Steven; Roeffaers, Maarten B J; Meijer, E W; Hofkens, Johan; Debroye, Elke