Thickness dependent oxidation in CrCl(3): a scanning X-ray photoemission and Kelvin probe microscopies study
三氯化铬(CrCl(3))中厚度依赖性氧化:扫描X射线光电子能谱和开尔文探针显微镜研究
期刊:Beilstein Journal of Nanotechnology
影响因子:2.7
doi:10.3762/bjnano.16.58
Kazim, Shafaq; Parmar, Rahul; Azizinia, Maryam; Amati, Matteo; Rauf, Muhammad; Di Cicco, Andrea; Rezvani, Seyed Javid; Mastrippolito, Dario; Ottaviano, Luca; Klimczuk, Tomasz; Gregoratti, Luca; Gunnella, Roberto