Nanoscale imaging of buried topological defects with quantitative X-ray magnetic microscopy
利用定量X射线磁显微镜对埋藏拓扑缺陷进行纳米尺度成像
期刊:Nature Communications
影响因子:15.7
doi:10.1038/ncomms9196
Blanco-Roldán, C; Quirós, C; Sorrentino, A; Hierro-Rodríguez, A; Álvarez-Prado, L M; Valcárcel, R; Duch, M; Torras, N; Esteve, J; Martín, J I; Vélez, M; Alameda, J M; Pereiro, E; Ferrer, S
