日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Optical interference for the guidance of cryogenic focused ion beam milling beyond the axial diffraction limit

利用光学干涉技术引导低温聚焦离子束铣削超越轴向衍射极限

Sica, Anthony V; Zaoralová, Magda; Antolini, Cali; Boltje, Daan B; Penzes, Judit J; Malmqvist, Lilyana M; Jensen, Grant J; Kaelber, Jason T; Dahlberg, Peter D

Tapping-Mode SQUID-on-Tip Microscopy with Proximity Josephson Junctions

带有近距离约瑟夫森结的轻敲模式SQUID尖端显微镜

Rog, Matthijs; Blom, Tycho J; Boltje, Daan B; de Haan, Jimi D; Fermin, Remko; Niu, Jiasen; Doedes, Yasmin C; Allan, Milan P; Lahabi, Kaveh

Thickness- and quality-controlled fabrication of fluorescence-targeted frozen-hydrated lamellae.

厚度和质量可控的荧光靶向冷冻水合薄片的制备

Boltje Daan B, Skoupý Radim, Taisne Clémence, Evers Wiel H, Jakobi Arjen J, Hoogenboom Jacob P

Workflow for Fluorescence-Targeted Lamella Milling From Vitrified Cells With a Coincident Fluorescence, Electron, and Ion Beam Microscope

利用荧光、电子和离子束显微镜对玻璃化细胞进行荧光靶向层状研磨的工作流程

Perton, Elise G; Boltje, Daan B; Jakobi, Arjen J; Hoogenboom, Jacob P

A cryogenic, coincident fluorescence, electron, and ion beam microscope

低温、符合荧光、电子和离子束显微镜

Boltje, Daan B; Hoogenboom, Jacob P; Jakobi, Arjen J; Jensen, Grant J; Jonker, Caspar T H; Kaag, Max J; Koster, Abraham J; Last, Mart G F; de Agrela Pinto, Cecilia; Plitzko, Jürgen M; Raunser, Stefan; Tacke, Sebastian; Wang, Zhexin; van der Wee, Ernest B; Wepf, Roger; den Hoedt, Sander