Approaching maximum resolution in structured illumination microscopy via accurate noise modeling.
通过精确的噪声建模，在结构光照明显微镜中接近最高分辨率
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影响因子:
doi:10.1038/s44303-024-00066-8
Saurabh Ayush, Brown Peter T, Bryan Iv J Shepard, Fox Zachary R, Kruithoff Rory, Thompson Cristopher, Kural Comert, Shepherd Douglas P, Pressé Steve
