Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques
利用透射电子显微镜及相关技术分析复杂的、对电子束敏感的材料
期刊:Philosophical Transactions of the Royal Society A-Mathematical Physical and Engineering Sciences
影响因子:3.7
doi:10.1098/rsta.2019.0601
Ilett, Martha; S'ari, Mark; Freeman, Helen; Aslam, Zabeada; Koniuch, Natalia; Afzali, Maryam; Cattle, James; Hooley, Robert; Roncal-Herrero, Teresa; Collins, Sean M; Hondow, Nicole; Brown, Andy; Brydson, Rik