X-ray microtomography using correlation of near-field speckles for material characterization
利用近场散斑相关性的X射线显微断层扫描技术进行材料表征
期刊:Proceedings of the National Academy of Sciences of the United States of America
影响因子:9.1
doi:10.1073/pnas.1502828112
Zanette, Irene; Zdora, Marie-Christine; Zhou, Tunhe; Burvall, Anna; Larsson, Daniel H; Thibault, Pierre; Hertz, Hans M; Pfeiffer, Franz
