Origin of Threshold Voltage Instabilities in Indium Oxide Transistors
氧化铟晶体管阈值电压不稳定性成因
期刊:ACS Applied Materials & Interfaces
影响因子:8.2
doi:10.1021/acsami.5c20018
Lin, Tzu-Jie; Chen, Sheng-Chung; Lee, Yung-Ting; Cheng, Sheng-Lun; Tseng, Robert; Wang, Sung-Tsun; Chang, Yu-Cheng; Pan, Yi-Yu; Chang, Chan-Yuen; Chou, Tsung-Te; Lin, Chia-Hsien; Ku, Ching-Shun; Lin, Chun-Liang; Liu, Po-Tsun; Kim, Hyungjin; Lien, Der-Hsien