Electron Microscopy Transfer System to Protect Atmosphere-Sensitive Materials for Scanning Electron Microscopy Characterization
用于保护对大气敏感材料进行扫描电子显微镜表征的电子显微镜转移系统
期刊:Microscopy Research and Technique
影响因子:2.1
doi:10.1002/jemt.70107
Corcoran, Louis G; Monzo, Ellen M; Onuoha, Chinomso E; Varshney, Shivasheesh; Lee, Han Seung; Frethem, Chris; Jalan, Bharat; McCormick, Alon V; Penn, R Lee