On the Thermal Models for Resistive Random Access Memory Circuit Simulation
关于电阻式随机存取存储器电路仿真的热模型
期刊:Nanomaterials
影响因子:4.3
doi:10.3390/nano11051261
Roldán, Juan B; González-Cordero, Gerardo; Picos, Rodrigo; Miranda, Enrique; Palumbo, Félix; Jiménez-Molinos, Francisco; Moreno, Enrique; Maldonado, David; Baldomá, Santiago B; Moner Al Chawa, Mohamad; de Benito, Carol; Stavrinides, Stavros G; Suñé, Jordi; Chua, Leon O