Defect Characterization of the SiO(2)/Si Interface Investigated by Drift-Assisted Positron Annihilation Lifetime Spectroscopy
利用漂移辅助正电子湮没寿命谱研究SiO(2)/Si界面缺陷
期刊:Nanomaterials
影响因子:4.3
doi:10.3390/nano16030156
Helm, Ricardo; Egger, Werner; Corbel, Catherine; Sperr, Peter; Butterling, Maik; Wagner, Andreas; Liedke, Maciej Oskar; Hirschmann, Eric; Mitteneder, Johannes; Mayerhofer, Michael; Lee, Kangho; Duesberg, Georg S; Dollinger, Günther; Dickmann, Marcel
