Correlated X-Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire
单根双相GaAs纳米线的X射线和电子显微镜关联分析
期刊:Small Methods
影响因子:9.1
doi:10.1002/smtd.202500740
Dursap, Thomas; Zhou, Tao; Dupraz, Maxime; Labat, Stéphane; Thomas, Olivier; Fardeau, Niels; Regreny, Philippe; Gendry, Michel; Brottet, Solène; Blanchard, Nicholas P; Holt, Martin V; Richard, Marie-Ingrid; Danescu, Alexandru; Penuelas, José; Bugnet, Matthieu