日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals

氨热法制备的GaN晶体中具有六边形蜂窝状排列的大尺度缺陷团簇

Kirste, Lutz; Tran Thi Caliste, Thu Nhi; Weyher, Jan L; Smalc-Koziorowska, Julita; Zajac, Magdalena A; Kucharski, Robert; Sochacki, Tomasz; Grabianska, Karolina; Iwinska, Malgorzata; Detlefs, Carsten; Danilewsky, Andreas N; Bockowski, Michal; Baruchel, José

X-ray diffraction imaging of fully packaged n-p-n transistors under accelerated ageing conditions

在加速老化条件下对完全封装的NPN晶体管进行X射线衍射成像

Tanner, Brian K; Danilewsky, Andreas; McNally, Patrick J

Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage

硅片不规则破损的实时直接和衍射X射线成像

Rack, Alexander; Scheel, Mario; Danilewsky, Andreas N

Crack propagation and fracture in silicon wafers under thermal stress.

热应力作用下硅晶片的裂纹扩展和断裂

Danilewsky Andreas, Wittge Jochen, Kiefl Konstantin, Allen David, McNally Patrick, Garagorri Jorge, Elizalde M Reyes, Baumbach Tilo, Tanner Brian K