Compact snapshot dual-mode interferometric system for on-machine measurement
用于机上测量的紧凑型快照式双模干涉测量系统
期刊:Optics and Lasers in Engineering
影响因子:3.7
doi:10.1016/j.optlaseng.2020.106129
Wang, Daodang; Fu, Xiangyu; Xu, Ping; Tian, Xiaobo; Spires, Oliver; Liang, Jian; Wu, Heng; Liang, Rongguang
