Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV curve and Complex Admittance Measurements
利用I-V曲线和复导纳测量绘制TES温度灵敏度和电流灵敏度随温度、电流和磁场的变化曲线
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doi:10.1007/s10909-018-1970-8
Zhou, Y; Ambarish, C V; Gruenke, R; Jaeckel, F T; Kripps, K L; McCammon, D; Morgan, K M; Wulf, D; Zhang, S; Adams, J S; Bandler, S R; Chervenak, J A; Datesman, A M; Eckart, M E; Ewin, A J; Finkbeiner, F M; Kelley, R L; Kilbourne, C A; Miniussi, A R; Porter, F S; Sadleir, J E; Sakai, K; Smith, S J; Wakeham, N A; Wassell, E J; Yoon, W