Determining by Raman spectroscopy the average thickness and N-layer-specific surface coverages of MoS(2) thin films with domains much smaller than the laser spot size
利用拉曼光谱法测定畴尺寸远小于激光光斑尺寸的MoS₂薄膜的平均厚度和N层特定表面覆盖率。
期刊:Beilstein Journal of Nanotechnology
影响因子:2.7
doi:10.3762/bjnano.15.26
Wasem Klein, Felipe; Huntzinger, Jean-Roch; Astié, Vincent; Voiry, Damien; Parret, Romain; Makhlouf, Houssine; Juillaguet, Sandrine; Decams, Jean-Manuel; Contreras, Sylvie; Landois, Périne; Zahab, Ahmed-Azmi; Sauvajol, Jean-Louis; Paillet, Matthieu
