FAST-EM array tomography: a workflow for multibeam volume electron microscopy
快速电镜阵列断层扫描:多束体积电子显微镜的工作流程
期刊:
影响因子:
doi:10.1515/mim-2024-0005
Kievits, Arent J; Duinkerken, B H Peter; Lane, Ryan; de Heus, Cecilia; van Beijeren Bergen En Henegouwen, Daan; Höppener, Tibbe; Wolters, Anouk H G; Liv, Nalan; Giepmans, Ben N G; Hoogenboom, Jacob P