Characterizing the Intrinsic Background in XPS Using the Narrow-Shirley Approach
利用窄-雪莉方法表征XPS中的固有背景
期刊:Journal of Physical Chemistry C
影响因子:3.2
doi:10.1021/acs.jpcc.5c07020
Herrera-Gomez, Alberto; Guzman-Bucio, Dulce; Cabrera-German, Dagoberto; Dutoi, Antony D; Vazquez-Lepe, Milton Oswaldo; Cortazar-Martinez, Orlando; Carmona-Carmona, Abraham Jorge