Characterization of Complex Stacking of Semiconductors Through Near Field Imaging and Spectroscopy
利用近场成像和光谱技术表征半导体的复杂堆叠结构
期刊:Advanced Materials
影响因子:26.8
doi:10.1002/adma.202507645
Tailpied, Laure; Gureghian, Clément; Fossard, Fréderic; Mérot, Jean-Sébastien; Rodriguez, Jean-Baptiste; Flores, Fernando Gonzalez-Posada; Vincent, Grégory; Taliercio, Thierry; Fix, Baptiste