A comparison of methods to harmonize cortical thickness measurements across scanners and sites
比较不同扫描仪和站点间皮质厚度测量方法的一致性
期刊:Neuroimage
影响因子:4.5
doi:10.1016/j.neuroimage.2022.119509
Sun, Delin; Rakesh, Gopalkumar; Haswell, Courtney C; Logue, Mark; Baird, C Lexi; O'Leary, Erin N; Cotton, Andrew S; Xie, Hong; Tamburrino, Marijo; Chen, Tian; Dennis, Emily L; Jahanshad, Neda; Salminen, Lauren E; Thomopoulos, Sophia I; Rashid, Faisal; Ching, Christopher R K; Koch, Saskia B J; Frijling, Jessie L; Nawijn, Laura; van Zuiden, Mirjam; Zhu, Xi; Suarez-Jimenez, Benjamin; Sierk, Anika; Walter, Henrik; Manthey, Antje; Stevens, Jennifer S; Fani, Negar; van Rooij, Sanne J H; Stein, Murray; Bomyea, Jessica; Koerte, Inga K; Choi, Kyle; van der Werff, Steven J A; Vermeiren, Robert R J M; Herzog, Julia; Lebois, Lauren A M; Baker, Justin T; Olson, Elizabeth A; Straube, Thomas; Korgaonkar, Mayuresh S; Andrew, Elpiniki; Zhu, Ye; Li, Gen; Ipser, Jonathan; Hudson, Anna R; Peverill, Matthew; Sambrook, Kelly; Gordon, Evan; Baugh, Lee; Forster, Gina; Simons, Raluca M; Simons, Jeffrey S; Magnotta, Vincent; Maron-Katz, Adi; du Plessis, Stefan; Disner, Seth G; Davenport, Nicholas; Grupe, Daniel W; Nitschke, Jack B; deRoon-Cassini, Terri A; Fitzgerald, Jacklynn M; Krystal, John H; Levy, Ifat; Olff, Miranda; Veltman, Dick J; Wang, Li; Neria, Yuval; De Bellis, Michael D; Jovanovic, Tanja; Daniels, Judith K; Shenton, Martha; van de Wee, Nic J A; Schmahl, Christian; Kaufman, Milissa L; Rosso, Isabelle M; Sponheim, Scott R; Hofmann, David Bernd; Bryant, Richard A; Fercho, Kelene A; Stein, Dan J; Mueller, Sven C; Hosseini, Bobak; Phan, K Luan; McLaughlin, Katie A; Davidson, Richard J; Larson, Christine L; May, Geoffrey; Nelson, Steven M; Abdallah, Chadi G; Gomaa, Hassaan; Etkin, Amit; Seedat, Soraya; Harpaz-Rotem, Ilan; Liberzon, Israel; van Erp, Theo G M; Quidé, Yann; Wang, Xin; Thompson, Paul M; Morey, Rajendra A