A comprehensive overview of focused ion beam-scanning electron microscopy (FIB-SEM) applications for the evaluation of outer retina
本文全面概述了聚焦离子束扫描电子显微镜 (FIB-SEM) 在评估外层视网膜中的应用。
期刊:Frontiers in Cell and Developmental Biology
影响因子:4.3
doi:10.3389/fcell.2025.1586029
Ch, Sanjay; Lim, Rayne R; Low, Shermaine W Y; Grant, Deana G; Patterson, Sam; Ramasubramanian, Aparna; Gadicherla, Ashish K; Chaurasia, Shyam S