Deep learning-driven conversion of scanning superlens microscopy to high depth-of-field SEM-like imaging
利用深度学习将扫描超透镜显微镜转换为高景深、类似扫描电镜的成像方式
期刊:Microsystems & Nanoengineering
影响因子:9.9
doi:10.1038/s41378-025-01060-9
Sun, Hui; Luo, Hao; Wang, Feifei; Chen, Qingjiu; Chen, Meng; Wang, Xiaoduo; Yu, Haibo; Zhang, Guanglie; Liu, Lianqing; Wang, Jianping; Wu, Dapeng; Li, Wen Jung