A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors
基于技术计算机辅助设计的DRAM存储电容器可靠性预测模型
期刊:Micromachines
影响因子:3
doi:10.3390/mi10040256
Choi, Woo Young; Yoon, Gyuhan; Chung, Woo Young; Cho, Younghoon; Shin, Seongun; Ahn, Kwang Ho
