Probing the accuracy and precision of Hirshfeld atom refinement with HARt interfaced with Olex2
利用 HARt 与 Olex2 接口探究 Hirshfeld 原子精修的准确性和精确度
期刊:IUCrJ
影响因子:3.6
doi:10.1107/S2052252517015548
Fugel, Malte; Jayatilaka, Dylan; Hupf, Emanuel; Overgaard, Jacob; Hathwar, Venkatesha R; Macchi, Piero; Turner, Michael J; Howard, Judith A K; Dolomanov, Oleg V; Puschmann, Horst; Iversen, Bo B; Bürgi, Hans-Beat; Grabowsky, Simon