日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

High-throughput X-ray total scattering measurement system at BL04B2 of SPring-8

SPring-8 BL04B2光束线上的高通量X射线总散射测量系统

Yamada, Hiroki; Shimono, Seiya; Kawaguchi, Shogo; Ohara, Koji; Watanabe, Kei; Takemoto, Michitaka; Tseng, Jo Chi; Takahashi, Masakuni; Sada, Yuki; Yamazaki, Hiroshi; Ohashi, Haruhiko; Imai, Yasuhiko; Hatsui, Takaki; Inoue, Ichiro; Kimura, Shigeru; Sugimoto, Kunihisa; Yabashi, Makina; Sakata, Osami; Higo, Yuji; Tamasaku, Kenji

Spatiotemporal mapping of alloy mesostructure dynamics via multimodal coherent X-ray diffraction imaging

利用多模相干X射线衍射成像技术对合金介观结构动力学进行时空映射

Takazawa, Shuntaro; Ninomiya, Kakeru; Ha, Minh-Quyet; Vu, Tien-Sinh; Sasaki, Yuhei; Abe, Masaki; Uematsu, Hideshi; Okawa, Naru; Ishiguro, Nozomu; Ozaki, Kyosuke; Hatsui, Takaki; Hoshino, Taiki; Nishibori, Maiko; Dam, Hieu-Chi; Takahashi, Yukio

Quantitative assessment of ohmic-type CdTe sensor response in a photon-counting X-ray imaging detector under continuous 12-49 keV irradiations

在连续12-49 keV辐照下,光子计数X射线成像探测器中欧姆型CdTe传感器响应的定量评估

Orsini, Fabienne; Imai, Yasuhiko; Hatsui, Takaki

Quantifying bunch-mode influence on photon-counting detectors at SPring-8

量化SPring-8上束团模式对光子计数探测器的影响

Imai, Yasuhiko; Hatsui, Takaki

High-throughput and high-resolution powder X-ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample-to-detector distance and innovative automation system

高通量、高分辨率粉末X射线衍射仪,由六组二维CdTe探测器组成,具有可变的样品-探测器距离和创新的自动化系统。

Kawaguchi, Shogo; Kobayashi, Shintaro; Yamada, Hiroki; Ashitani, Hirotaka; Takemoto, Michitaka; Imai, Yasuhiko; Hatsui, Takaki; Sugimoto, Kunihisa; Sakata, Osami

Bragg coherent diffraction imaging with the CITIUS charge-integrating detector

利用CITIUS电荷积分探测器进行布拉格相干衍射成像

Grimes, Michael; Pauwels, Kristof; Schülli, Tobias U; Martin, Thierry; Fajardo, Pablo; Douissard, Paul-Antoine; Kocsis, Menyhert; Nishino, Haruki; Ozaki, Kyosuke; Honjo, Yoshiaki; Nishiyama Hiraki, Toshiyuki; Joti, Yasumasa; Hatsui, Takaki; Levi, Mor; Rabkin, Eugen; Leake, Steven J; Richard, Marie-Ingrid

Visualizing interface-specific chemical bonds in adhesive bonding of carbon fiber structural composites using soft X-ray microscopy

利用软X射线显微镜可视化碳纤维结构复合材料粘接中的界面特异性化学键

Yamane, Hiroyuki; Oura, Masaki; Yamazaki, Noriko; Ishihara, Tomoko; Hasegawa, Koichi; Ishikawa, Tetsuya; Takagi, Kiyoka; Hatsui, Takaki

Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

利用低质量单次相干衍射数据进行单纳米颗粒结构测定的改进

Nishiyama, Toshiyuki; Niozu, Akinobu; Bostedt, Christoph; Ferguson, Ken R; Sato, Yuhiro; Hutchison, Christopher; Nagaya, Kiyonobu; Fukuzawa, Hironobu; Motomura, Koji; Wada, Shin-Ichi; Sakai, Tsukasa; Matsunami, Kenji; Matsuda, Kazuhiro; Tachibana, Tetsuya; Ito, Yuta; Xu, Weiqing; Mondal, Subhendu; Umemoto, Takayuki; Nicolas, Christophe; Miron, Catalin; Kameshima, Takashi; Joti, Yasumasa; Tono, Kensuke; Hatsui, Takaki; Yabashi, Makina; Ueda, Kiyoshi

Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

开发一种扫描式软X射线光谱显微镜,用于在从低真空到氦气气氛的各种条件下研究先进材料表面和界面上的局部电子结构

Oura, Masaki; Ishihara, Tomoko; Osawa, Hitoshi; Yamane, Hiroyuki; Hatsui, Takaki; Ishikawa, Tetsuya

A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements

一种用于校正微带探测器中X射线响应不均匀性的统计方法,以实现高精度、高分辨率的总散射测量

Kato, Kenichi; Tanaka, Yoshihito; Yamauchi, Miho; Ohara, Koji; Hatsui, Takaki