Super-resolution approach tailored for wafer transmission electron microscopy images
针对晶圆透射电子显微镜图像的超分辨率方法
期刊:Scientific Reports
影响因子:3.9
doi:10.1038/s41598-026-45776-8
Kim, Sungsu; Baek, Insung; Cho, Hansam; Jo, Yongwon; Roh, Heejoong; Kim, Kyunghye; Jo, Munki; Tae, Jaeung; Kim, Seoung Bum