Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO(2) Resistive Random Access Memories to Address Device Variability
利用空间分辨测温技术研究TiO(2)电阻式随机存取存储器中丝状纳米级热点,以解决器件差异性问题
期刊:ACS Applied Electronic Materials
影响因子:4.7
doi:10.1021/acsaelm.3c00782
Swoboda, Timm; Gao, Xing; Rosário, Carlos M M; Hui, Fei; Zhu, Kaichen; Yuan, Yue; Deshmukh, Sanchit; Köroǧlu, Çaǧıl; Pop, Eric; Lanza, Mario; Hilgenkamp, Hans; Rojo, Miguel Muñoz