Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
离子计数辅助显微镜的散粒噪声抑制二次电子成像
期刊:Proceedings of the National Academy of Sciences of the United States of America
影响因子:9.1
doi:10.1073/pnas.2401246121
Agarwal, Akshay; Kasaei, Leila; He, Xinglin; Kitichotkul, Ruangrawee; Hitit, Oğuz Kağan; Peng, Minxu; Schultz, J Albert; Feldman, Leonard C; Goyal, Vivek K