Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
用于获得可靠且可溯源至国际单位制的多模态和复杂形状参考纳米颗粒尺寸结果的计量规程
期刊:Nanomaterials
影响因子:4.3
doi:10.3390/nano13060993
Feltin, Nicolas; Crouzier, Loïc; Delvallée, Alexandra; Pellegrino, Francesco; Maurino, Valter; Bartczak, Dorota; Goenaga-Infante, Heidi; Taché, Olivier; Marguet, Sylvie; Testard, Fabienne; Artous, Sébastien; Saint-Antonin, François; Salzmann, Christoph; Deumer, Jérôme; Gollwitzer, Christian; Koops, Richard; Sebaïhi, Noham; Fontanges, Richard; Neuwirth, Matthias; Bergmann, Detlef; Hüser, Dorothee; Klein, Tobias; Hodoroaba, Vasile-Dan