Full Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency Microscopy
利用声子增强和频显微镜对六方氮化硼单层进行全晶体学成像
期刊:Advanced Materials
影响因子:26.8
doi:10.1002/adma.202510124
Mueller, Niclas S; Fellows, Alexander P; John, Ben; Naclerio, Andrew E; Carbogno, Christian; Gharagozloo-Hubmann, Katayoun; Baláž, Damián; Kowalski, Ryan A; Heenen, Hendrik H; Scheurer, Christoph; Reuter, Karsten; Caldwell, Joshua D; Wolf, Martin; Kidambi, Piran R; Thämer, Martin; Paarmann, Alexander