Phase transitions in random circuit sampling
随机电路采样中的相变
期刊:Nature
影响因子:48.5
doi:10.1038/s41586-024-07998-6
Morvan, A; Villalonga, B; Mi, X; Mandrà, S; Bengtsson, A; Klimov, P V; Chen, Z; Hong, S; Erickson, C; Drozdov, I K; Chau, J; Laun, G; Movassagh, R; Asfaw, A; Brandão, L T A N; Peralta, R; Abanin, D; Acharya, R; Allen, R; Andersen, T I; Anderson, K; Ansmann, M; Arute, F; Arya, K; Atalaya, J; Bardin, J C; Bilmes, A; Bortoli, G; Bourassa, A; Bovaird, J; Brill, L; Broughton, M; Buckley, B B; Buell, D A; Burger, T; Burkett, B; Bushnell, N; Campero, J; Chang, H-S; Chiaro, B; Chik, D; Chou, C; Cogan, J; Collins, R; Conner, P; Courtney, W; Crook, A L; Curtin, B; Debroy, D M; Barba, A Del Toro; Demura, S; Paolo, A Di; Dunsworth, A; Faoro, L; Farhi, E; Fatemi, R; Ferreira, V S; Burgos, L Flores; Forati, E; Fowler, A G; Foxen, B; Garcia, G; Genois, É; Giang, W; Gidney, C; Gilboa, D; Giustina, M; Gosula, R; Dau, A Grajales; Gross, J A; Habegger, S; Hamilton, M C; Hansen, M; Harrigan, M P; Harrington, S D; Heu, P; Hoffmann, M R; Huang, T; Huff, A; Huggins, W J; Ioffe, L B; Isakov, S V; Iveland, J; Jeffrey, E; Jiang, Z; Jones, C; Juhas, P; Kafri, D; Khattar, T; Khezri, M; Kieferová, M; Kim, S; Kitaev, A; Klots, A R; Korotkov, A N; Kostritsa, F; Kreikebaum, J M; Landhuis, D; Laptev, P; Lau, K-M; Laws, L; Lee, J; Lee, K W; Lensky, Y D; Lester, B J; Lill, A T; Liu, W; Livingston, W P; Locharla, A; Malone, F D; Martin, O; Martin, S; McClean, J R; McEwen, M; Miao, K C; Mieszala, A; Montazeri, S; Mruczkiewicz, W; Naaman, O; Neeley, M; Neill, C; Nersisyan, A; Newman, M; Ng, J H; Nguyen, A; Nguyen, M; Niu, M Yuezhen; O'Brien, T E; Omonije, S; Opremcak, A; Petukhov, A; Potter, R; Pryadko, L P; Quintana, C; Rhodes, D M; Rocque, C; Rosenberg, E; Rubin, N C; Saei, N; Sank, D; Sankaragomathi, K; Satzinger, K J; Schurkus, H F; Schuster, C; Shearn, M J; Shorter, A; Shutty, N; Shvarts, V; Sivak, V; Skruzny, J; Smith, W C; Somma, R D; Sterling, G; Strain, D; Szalay, M; Thor, D; Torres, A; Vidal, G; Heidweiller, C Vollgraff; White, T; Woo, B W K; Xing, C; Yao, Z J; Yeh, P; Yoo, J; Young, G; Zalcman, A; Zhang, Y; Zhu, N; Zobrist, N; Rieffel, E G; Biswas, R; Babbush, R; Bacon, D; Hilton, J; Lucero, E; Neven, H; Megrant, A; Kelly, J; Roushan, P; Aleiner, I; Smelyanskiy, V; Kechedzhi, K; Chen, Y; Boixo, S
