Approaching Maximum Resolution in Structured Illumination Microscopy via Accurate Noise Modeling
通过精确的噪声建模实现结构照明显微镜的最大分辨率
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doi:10.1101/2023.12.07.570701
Ayush Saurabh, Peter T Brown, J Shepard Bryan 4th, Zachary R Fox, Rory Kruithoff, Cristopher Thompson, Comert Kural, Douglas P Shepherd, Steve Pressé
