Physical correlation between stochasticity and process-induced damage in ferroelectric memory devices
铁电存储器件中随机性和工艺诱导损伤之间的物理关联
期刊:Nano Convergence
影响因子:11
doi:10.1186/s40580-025-00505-1
Koo, Ryun-Han; Kim, Seungwhan; Im, Jiseong; Ryu, Sangwoo; Choi, Kangwook; Park, Sung-Ho; Ko, Jonghyun; Ji, Jongho; Oh, Mingyun; Kim, Jangsaeng; Jung, Gyuweon; Lee, Sung-Tae; Kwon, Daewoong; Shin, Wonjun; Lee, Jong-Ho