QTL Mapping of Yield-Related Traits in Tetraploid Wheat Based on Wheat55K SNP Array
基于Wheat55K SNP芯片的四倍体小麦产量相关性状QTL定位
期刊:Plants-Basel
影响因子:
doi:10.3390/plants13101285
Yatao Jia, Yifan Zhang, Yingkai Sun, Chao Ma, Yixiong Bai, Hanbing Zhang, Junbin Hou, Yong Wang, Wanquan Ji, Haibo Bai, Shuiyuan Hao, Zhonghua Wang