日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Semiconductor Chip Electrical Interconnection and Bonding by Nano-Locking with Ultra-Fine Bond-Line Thickness

采用纳米锁定技术实现半导体芯片的电互连和键合,键合线厚度超薄

Guo, Jielin; Shih, Yu-Chou; Sheikhi, Roozbeh; You, Jiun-Pyng; Shi, Frank G