日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Low Buffer Trapping Effects above 1200 V in Normally off GaN-on-Silicon Field Effect Transistors

低缓冲层陷阱效应(高于 1200 V)在常关型硅基氮化镓场效应晶体管中

Abid, Idriss; Hamdaoui, Youssef; Mehta, Jash; Derluyn, Joff; Medjdoub, Farid

On the Gymnastics of Memory: Stiegler, Positive Pharmacology, and Illiteracy

论记忆的体操:斯蒂格勒、积极药理学和文盲

Bradley, Joff P N

Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment

通过缓冲层分解实验研究GaN-on-Si叠层中的垂直泄漏

Tajalli, Alaleh; Borga, Matteo; Meneghini, Matteo; De Santi, Carlo; Benazzi, Davide; Besendörfer, Sven; Püsche, Roland; Derluyn, Joff; Degroote, Stefan; Germain, Marianne; Kabouche, Riad; Abid, Idriss; Meissner, Elke; Zanoni, Enrico; Medjdoub, Farid; Meneghesso, Gaudenzio