In situ monitoring of thin alumina passive film growth by surface plasmon resonance (SPR) during an electrochemical process
利用表面等离子体共振(SPR)技术对电化学过程中氧化铝钝化膜的生长进行原位监测
期刊:Scientific Reports
影响因子:3.9
doi:10.1038/s41598-024-64378-w
Dutems, J; Crespo-Monteiro, N; Faverjon, F; Gâté, V; Turover, D; Marcellin, S; Ter-Ovanessian, B; Héau, C; Verrier, I; Normand, B; Jourlin, Y