日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Geometrical structure and interface dependence of bias stress induced threshold voltage shift in C60-based OFETs

C60基OFET中偏置应力引起的阈值电压漂移与几何结构和界面依赖性的关系

Ahmed, Rizwan; Kadashchuk, Andrey; Simbrunner, Clemens; Schwabegger, Günther; Baig, Muhammad Aslam; Sitter, Helmut

Electric field and grain size dependence of Meyer-Neldel energy in C(60) films

C(60)薄膜中Meyer-Neldel能量对电场和晶粒尺寸的依赖性

Ullah, Mujeeb; Pivrikas, A; Fishchuk, I I; Kadashchuk, A; Stadler, P; Simbrunner, C; Sariciftci, N S; Sitter, H