Assemblathon 1: a competitive assessment of de novo short read assembly methods
Assemblathon 1:从头短读组装方法的竞争性评估
期刊:Genome Research
影响因子:5.5
doi:10.1101/gr.126599.111
Earl, Dent; Bradnam, Keith; St John, John; Darling, Aaron; Lin, Dawei; Fass, Joseph; Yu, Hung On Ken; Buffalo, Vince; Zerbino, Daniel R; Diekhans, Mark; Nguyen, Ngan; Ariyaratne, Pramila Nuwantha; Sung, Wing-Kin; Ning, Zemin; Haimel, Matthias; Simpson, Jared T; Fonseca, Nuno A; Birol, İnanç; Docking, T Roderick; Ho, Isaac Y; Rokhsar, Daniel S; Chikhi, Rayan; Lavenier, Dominique; Chapuis, Guillaume; Naquin, Delphine; Maillet, Nicolas; Schatz, Michael C; Kelley, David R; Phillippy, Adam M; Koren, Sergey; Yang, Shiaw-Pyng; Wu, Wei; Chou, Wen-Chi; Srivastava, Anuj; Shaw, Timothy I; Ruby, J Graham; Skewes-Cox, Peter; Betegon, Miguel; Dimon, Michelle T; Solovyev, Victor; Seledtsov, Igor; Kosarev, Petr; Vorobyev, Denis; Ramirez-Gonzalez, Ricardo; Leggett, Richard; MacLean, Dan; Xia, Fangfang; Luo, Ruibang; Li, Zhenyu; Xie, Yinlong; Liu, Binghang; Gnerre, Sante; MacCallum, Iain; Przybylski, Dariusz; Ribeiro, Filipe J; Yin, Shuangye; Sharpe, Ted; Hall, Giles; Kersey, Paul J; Durbin, Richard; Jackman, Shaun D; Chapman, Jarrod A; Huang, Xiaoqiu; DeRisi, Joseph L; Caccamo, Mario; Li, Yingrui; Jaffe, David B; Green, Richard E; Haussler, David; Korf, Ian; Paten, Benedict