Parsing digital or analogue TCR performance through piconewton forces
通过皮牛顿力解析数字或模拟TCR性能
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doi:10.1101/2023.11.29.568292
Akitsu, Aoi; Kobayashi, Eiji; Feng, Yinnian; Stephens, Hannah M; Brazin, Kristine N; Masi, Daniel J; Kirpatrick, Evan H; Mallis, Robert J; Duke-Cohan, Jonathan S; Booker, Matthew A; Cinella, Vincenzo; Feng, William W; Holliday, Elizabeth L; Lee, Jonathan J; Zienkiewicz, Katarzyna J; Tolstorukov, Michael Y; Hwang, Wonmuk; Lang, Matthew J; Reinherz, Ellis L