Repurposing Si CMOS nonidealities for stochastic and analog image processing
利用硅CMOS非理想特性进行随机和模拟图像处理
期刊:Science Advances
影响因子:12.5
doi:10.1126/sciadv.aea2328
Kwak, Been; Koo, Ryun-Han; Han, Changhyeon; Shin, Yunho; Choi, Joonhyeok; Kim, Dongbin; Lee, Jongwoo; Im, Jiseong; Cho, Youngchan; Lee, Jong-Ho; Shin, Wonjun; Kwon, Daewoong