Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
可追溯参考全计量链，适用于纳米级精度的创新型非球面和自由曲面光学表面
期刊:Sensors
影响因子:3.5
doi:10.3390/s21041103
Arezki, Yassir; Su, Rong; Heikkinen, Ville; Leprete, François; Posta, Pavel; Bitou, Youichi; Schober, Christian; Mehdi-Souzani, Charyar; Alzahrani, Bandar Abdulrahman Mohammed; Zhang, Xiangchao; Kondo, Yohan; Pruss, Christof; Ledl, Vit; Anwer, Nabil; Bouazizi, Mohamed Lamjed; Leach, Richard; Nouira, Hichem
