Automated Particle Size Analysis of Supported Nanoparticle TEM Images Using a Pre-Trained SAM Model
利用预训练的SAM模型对负载型纳米颗粒TEM图像进行自动粒度分析
期刊:Nanomaterials
影响因子:4.3
doi:10.3390/nano15241886
Zhong, Xiukun; Liang, Guohong; Meng, Lingbei; Xi, Wei; Gu, Lin; Tian, Nana; Zhai, Yong; He, Yutong; Huang, Yuqiong; Jin, Fengmin; Gao, Hong
