Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements
自终止衍射门飞秒X射线纳米晶体学测量
期刊:Nature Photonics
影响因子:32.9
doi:10.1038/nphoton.2011.297
Barty, Anton; Caleman, Carl; Aquila, Andrew; Timneanu, Nicusor; Lomb, Lukas; White, Thomas A; Andreasson, Jakob; Arnlund, David; Bajt, Saša; Barends, Thomas R M; Barthelmess, Miriam; Bogan, Michael J; Bostedt, Christoph; Bozek, John D; Coffee, Ryan; Coppola, Nicola; Davidsson, Jan; Deponte, Daniel P; Doak, R Bruce; Ekeberg, Tomas; Elser, Veit; Epp, Sascha W; Erk, Benjamin; Fleckenstein, Holger; Foucar, Lutz; Fromme, Petra; Graafsma, Heinz; Gumprecht, Lars; Hajdu, Janos; Hampton, Christina Y; Hartmann, Robert; Hartmann, Andreas; Hauser, Günter; Hirsemann, Helmut; Holl, Peter; Hunter, Mark S; Johansson, Linda; Kassemeyer, Stephan; Kimmel, Nils; Kirian, Richard A; Liang, Mengning; Maia, Filipe R N C; Malmerberg, Erik; Marchesini, Stefano; Martin, Andrew V; Nass, Karol; Neutze, Richard; Reich, Christian; Rolles, Daniel; Rudek, Benedikt; Rudenko, Artem; Scott, Howard; Schlichting, Ilme; Schulz, Joachim; Seibert, M Marvin; Shoeman, Robert L; Sierra, Raymond G; Soltau, Heike; Spence, John C H; Stellato, Francesco; Stern, Stephan; Strüder, Lothar; Ullrich, Joachim; Wang, X; Weidenspointner, Georg; Weierstall, Uwe; Wunderer, Cornelia B; Chapman, Henry N