Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis
用于DNA测序和表面分析的像差校正低能电子显微镜的研究进展
期刊:Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
影响因子:1.5
doi:10.1116/1.4764095
Mankos, Marian; Shadman, Khashayar; N'diaye, Alpha T; Schmid, Andreas K; Persson, Henrik H J; Davis, Ronald W