Measurement and Modeling of Short and Medium Range Order in Amorphous Ta2O5 Thin Films
非晶态 Ta2O5 薄膜中短程和中程有序性的测量与建模
期刊:Scientific Reports
影响因子:3.8
doi:10.1038/srep32170
Badri Shyam, Kevin H Stone, Riccardo Bassiri, Martin M Fejer, Michael F Toney, Apurva Mehta
