High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy.
高分辨率噪声替代法用于测量过拟合并验证单颗粒冷冻电镜三维结构测定的分辨率
期刊:Ultramicroscopy
影响因子:2
doi:10.1016/j.ultramic.2013.06.004
Chen Shaoxia, McMullan Greg, Faruqi Abdul R, Murshudov Garib N, Short Judith M, Scheres Sjors H W, Henderson Richard